Contact probes for semiconductor testing, IC sockets, probe cards
Flexible design and manufacturing according to inspection conditions. Small lots are also acceptable. Comprehensive support from assembly, wiring, to inspection.
Our company designs and manufactures "contact probes, IC sockets, and probe cards" used for semiconductor testing. ☆Contact Probes☆ We can flexibly accommodate not only standard products but also special specifications tailored to testing conditions. ☆Probe Cards and IC Sockets☆ We can provide consistent processing and assembly of resin, allowing us to offer testing fixtures suitable for the inspection target at a low cost. 【Examples of Support】 ◎ Narrow pitch support (manufactured with MIN P=80μ) ◎ High current testing (manufactured for pre-process testing of IGBT devices) ◎ Non-magnetic testing (probes made from non-magnetic materials) ◎ Others: high frequency (10GHz), high heat resistance (below 300℃), etc. 【Product Examples】 <Contact Probes> - Reduces replacement hassle. "Rare metal probes" with excellent durability. - Revised internal structure. "New bias probes" for stable resistance value measurement. <IC Sockets> - Non-magnetic compatible sockets. - High heat resistant sockets. <Probe Cards> - Probe cards compatible with min 80μ pitch. - High current load test probe cards. *For more details, please refer to the materials. Feel free to contact us with any inquiries.*
- Company:精研 本社
- Price:Other